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Beilstein J. Nanotechnol. 2020, 11, 1854–1864, doi:10.3762/bjnano.11.167
Figure 1: (a) Schematic representation of the STIM experiment. (b) Picture of the inner part of the chamber. ...
Figure 2: Micrographs of lacey carbon on carbon film. (a) Secondary electron imaging mode, (b) bright-field S...
Figure 3: Bright-field image showing contrast due to the dependence of the exit angle on the material and the...
Figure 4: Helium ion microscopy images of the nanoporous polycrystalline silicon membrane. (a) SE image. (b) ...
Figure 5: Thallium chloride evaporated on a TEM grid. (a) Secondary electron image. Inset of (a) shows the re...
Figure 6: STIM images of a single-crystalline silicon ⟨100⟩ membrane in (a) bright-field with θ ≤ 1.09°, and ...
Beilstein J. Nanotechnol. 2019, 10, 1648–1657, doi:10.3762/bjnano.10.160
Figure 1: Schematic of the transmission helium ion microscope (THIM).
Figure 2: For a BN sample, the voltage of Lens 2 was decreased from (A) to (E). A) A shadow image, B) a highe...
Figure 3: Examples of overfocus bright outline deflection patterns (A and D), underfocus spot patterns (B and...
Figure 4: A) HIM SE image with charge compensation by electron flooding and B) HIM SE image without charge co...
Figure 5: A) A THIM through-focus series of the MgO sample (coated with 10 nm Au on both sides) produced by d...